Two leaders from semiconductor equipment company KLA will visit UF Electrical & Computer Engineering on Friday, Nov. 8.
Dr. Chet Lenox and Mr. Bryan Crawford will both deliver industry-focused talks delving into the world of semiconductor manufacturing.
Dr. Chet Lenox
“KLA Introduction and Semiconductor Industry Challenges in an AI World”
Friday, Nov. 8 at 11:45am
MALA 7200
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Abstract
Dr. Chet Lenox of KLA Corporation will introduce how AI architectures are changing semiconductor requirements in both front-end fabs as well as advanced packaging, outlining multiple examples. In addition, Chet will outline the role played by KLA in these challenges.
Biography
Dr. Chet Lenox received his BS and MS from Texas A&M University and his PhD at the University of Texas, all in electrical engineering. After stints in semiconductor process development at Intel, National Semiconductor, and Texas Instruments, Dr. Lenox has spent the last 11 years working in technical customer engagement at KLA. His current role is Fellow and VP of the Industry and Customer Collaboration (ICC) Team, leading technical collaboration projects with key customers across front-end semiconductor, advanced packaging, IC substrates, and specialty semi for the company.
Bryan Crawford
“See It, Feel It, Resist It – Flexible Metrology Solutions for Materials Research”
Friday, Nov. 8 at 12:30pm
MALA 7200
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Abstract
Join me on a journey from the basic material science paradigm, Process-Structure-Properties, to the more complete Industry paradigm that includes material Performance. On this journey, we will examine Indium Tin Oxide (ITO), the ubiquitous conductive coating used in display applications. Metrology solutions in sheet resistance, profilometry, spectral reflectance, and nanoindentation are presented along with the fundamentals of these measurement techniques. Extensions for research using these metrology solutions and capabilities are presented at the end of the presentation.
Biography
Bryan Crawford is the KLA Nanoindenter Product Marketing Manager and has worked in instrumentation and metrology for almost 20 years with past roles as applications engineer, director of analytical services, business development, and product management. Prior to working in metrology, Bryan taught mathematics at a public high school. He has degrees in mathematics, mechanical engineering, and enterprise risk management. Bryan has authored and co-authored publications covering topics related to mechanical characterization of graphene, polymers, thin films, MEMS, battery, and metal materials.